The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jan. 11, 1994
Filed:
Oct. 27, 1992
Makoto Iwamoto, Yamatokoriyama, JP;
Shunsei Fukuchi, Nara, JP;
Hiroshi Takanashi, Kyoto, JP;
Kyouhei Isohata, Nara, JP;
Kenji Misono, Nara, JP;
Sharp Kabushiki Kaisha, Osaka, JP;
Abstract
First and second transparent hard plastic substrates are placed one over the other to form therebetween a gap into which a liquid crystal is to be sealed in. The first and second substrates are mounted on the reference plane of a stage. The distance between the first substrate and the reference plane is measured in a non-contact manner at a plurality of measuring points on a predetermined dividing line. Based on the distances measured, a slit is formed on the first substrate by cutting the first substrate along the dividing line while leaving a portion of a predetermined thickness uncut. The first substrate is then broken along the slit. With this arrangement, it is possible to cut the substrates while leaving a portion of an appropriate thickness uncut irrespective of unevenness of the thickness or waviness of the first substrate. Moreover, since the surfaces of the cut sections of the substrates do no crack and since the portions of the substrates to be broken have a reduced thickness, the divided sections have smoother surfaces.