The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jan. 11, 1994
Filed:
Sep. 05, 1991
Trent A Poole, South Amherst, MA (US);
Robert E Carter, Arlington, MA (US);
Amherst Process Instruments, Inc., Hadley, MA (US);
Abstract
A system for monitoring and analyzing impurities in a liquid by analyzing the non-volatile residue of droplets of the liquid includes a droplet generator for generating a stream of droplets of the liquid, a droplet inspection unit, a drop-on-demand unit for removing selected droplets from the stream of droplets, a heat exchanger for drying the droplets to provide non-volatile residue particles, and a particle size measurement unit. The droplet inspection unit determines the diameters of the droplets. A feedback arrangement from the droplet inspection unit controls droplet diameter by varying the droplet generation rate. The drop-on-demand unit removes a selected fraction of droplets from the droplet stream so as to reduce vapor loading in the heat exchanger and prevent agglomeration of droplets. The heat exchanger includes a first section for gradually increasing the temperature of the stream of droplets and a second section for maintaining the stream of droplets at the boiling temperature of the liquid. A vortex shedder can be used at the inlet to the heat exchanger to enhance heat transfer to the stream of droplets. The system can include an instrument for analyzing the composition of the particles.