The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jan. 11, 1994
Filed:
Nov. 04, 1991
Kabushiki Kaisha Toyota Chuo Kenkyusho, Aichi, JP;
Abstract
An electromagnetic field intensity measuring apparatus comprises a sensor located in the electromagnetic field measuring place for receiving the measuring light from the optical fiber, the sensor being adapted to modulate the measuring light entering the sensor depending on the intensity of the electromagnetic field, the modulated light being then re-applied to the optical fiber; a polarization rotating device located between the measuring light generating device and the optical fiber, the polarization rotation device being operative to cause the polarized wavefront of the measuring light passed therethrough to rotate a given angle in the direction of passage; and a polarization beam splitter disposed between the measuring light generating device and the polarization rotating device, the polarization beam splitter being operative to permit only the measuring light from said measuring light generating device to pass through said polarization beam splitter and also to reflect the modulated measuring light inputted through the polarization rotating device in a predetermined direction. The electromagnetic field intensity in the measuring place can be calculated, based on the amplitude of the measuring light reflected by the polarization beam splitter.