The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jan. 11, 1994

Filed:

Jan. 13, 1992
Applicant:
Inventors:

Tetsuji Yamaguchi, Kyoto, JP;

Juichiro Ukon, Ibaraki, JP;

Kazuyuki Ikemoto, Uji, JP;

Assignee:

Horiba, Ltd., Kyoto, JP;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01N / ; G01J / ;
U.S. Cl.
CPC ...
250347 ; 250339 ;
Abstract

An infrared microscopic spectrometer includes an optical system which allows for a shifting of the optical path interactive with a sample from a sample transmissive optical path to an optical path through an ATR crystal using ATR analysis. In the shown embodiment, the shift in the optical path is in a direction perpendicular to a transmissive optical axis, at least along a portion of the shift adjacent to the transmissive optical axis. The shift is undertaken by a moving means which moves the collecting element providing the infrared rays. A sample-holding structure allows the ATR crystal to be rotated or detachably removed, as necessary.


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