The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jan. 04, 1994

Filed:

Sep. 27, 1991
Applicant:
Inventors:

Kok Chen, E. Palo Alto, CA (US);

Randall G Guay, Cupertino, CA (US);

Assignee:

Apple Computer, Inc., Cupertino, CA (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
H04N / ;
U.S. Cl.
CPC ...
358443 ; 358426 ; 358467 ; 358133 ;
Abstract

An apparatus and method for producing high definition output images using an encoding scheme for differentiating between differing data types and context sensitive pixel modulation for dynamically shifting pixel growth direction during post-processing manipulation of the data.


Find Patent Forward Citations

Chen, Kok. (1994). Method and apparatus for high definition imaging (U.S. Patent No. 5276531). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/5276531

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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