The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jan. 04, 1994
Filed:
Jul. 28, 1989
Akira Maeda, Gardena, CA (US);
Koichi Sano, Sagamihara, JP;
Tetsuo Yokoyama, Tokyo, JP;
Hideaki Koizumi, Katsuta, JP;
Hitachi, Ltd., Tokyo, JP;
Abstract
A method and apparatus for MRI imaging capable of reducing the time between end of measurement and completion of image reconstruction by performing part of image reconstruction calculation in parallel with measurement of magnetic resonance signals, which particularly performs image reconstruction calculation up to (N-1) dimensions of N-dimensional image reconstruction calculation in parallel with measurement of signals and performs the image reconstruction calculation for the remaining one-dimensional direction after the measurement has been finished. When calculation for the last one dimension is performed, the (N-1)-dimensional images for which image reconstruction has been completed are successively displayed, and the image reconstruction calculation for the remaining one-dimensional direction is carried out not by FFT but by discrete Fourier transform, or such that the order of signal measurement is made in the bit reversed order for the order of phase encoding quantity, and thereby, a further portion of the image reconstruction calculation is carried out in parallel with the signal measurement.