The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jan. 04, 1994

Filed:

Aug. 21, 1991
Applicant:
Inventors:

Marek T Wlodarczyk, Birmingham, MI (US);

Daniel Vokovich, Ann Arbor, MI (US);

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01L / ; G01L / ;
U.S. Cl.
CPC ...
73705 ; 73708 ; 25022714 ; 2502311 ;
Abstract

The invention is related to numerous improvements for fiber optic measuring systems, and principally those utilizing a deformable diaphragm for sensing pressure. One aspect of the invention is providing temperature compensation for diaphragm characteristics. Temperature measurement can be achieved by using a light signal having a wavelength distribution which overlaps the cut-off characteristics of a filter positioned at the fiber sensing end. Shifting in the cut-off characteristic in response to temperature modulates the intensity of the reflected back temperature compensation signal. In another approach, temperature is measured through its differential effect on light signals having different launching conditions. With either approach, the temperature measurement is used to calibrate the output of the pressure sensitive diaphragm.


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