The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Dec. 28, 1993
Filed:
Jul. 31, 1991
Koichi Shinoda, Tokyo, JP;
NEC Corporation, Tokyo, JP;
Abstract
In a reference pattern adapting device for adapting reference pattern parameter groups (1-M) to adapted reference pattern parameter groups (1-M) by using training patterns (1-L) derived from a training pattern signal (TP). A similarity calculating unit (15) calculates a group of primary degrees of similarity between (a) each of M reference pattern element groups representative of reference patterns (output of a vector group memory 11) and (b) each of M reference pattern parameter groups (output of pattern parameter memory 12). A difference calculating unit (16) calculates a group of differences between reference pattern elements of each of the M reference pattern element groups and training pattern elements of each of L training pattern element groups representative of the training patterns (1-L). A first calculating unit (21) calculates a primary difference value by using the group of primary degrees of similarity and the group of differences. A second calculating unit (22) calculates a group of primary mean values by using each of L reference pattern parameter groups and the group of differences. The resulting group of primary mean values is output to an identifier (25) as one of L adapted pattern parameter groups.