The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Dec. 21, 1993
Filed:
Apr. 22, 1992
Wade A Winchip, Bettendorf, IA (US);
Michael A Ringle, Davenport, IA (US);
Aluminum Company of America, Pittsburgh, PA (US);
Abstract
A method and apparatus for measuring chatter marks on a metal workpiece. The method includes first removing gross buckle or curvature in the workpiece by clamping the same in the device having an elongated jaws and in a manner that locates a portion of the workpiece outside of the jaws so that an elongated portion of the workpiece is available for inspection by capacitive sensors. The sensors are located adjacent at least one surface of the elongated portion of the workpiece, the sensor and workpiece forming an electrical capacitor when appropriate potentials are applied to the sensor and workpiece. The sensors are now moved along the surface in the elongated direction of the workpiece to detect chatter marks on the surface.