The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Dec. 21, 1993
Filed:
May. 21, 1992
Nicholas Winograd, State College, PA (US);
Stephen J Benkovic, State College, PA (US);
The Pennsylvania Research Corporation, University Park, PA (US);
Abstract
An ion-beam based system enables quantitative analysis and visualization of a sample with atomic and molecular specificity. The system comprises a liquid metal ion source that directs a tightly focused beam of ions at the sample, the beam having an ion density that is insufficient to materially change the surface properties of the sample. A controller connected to the liquid metal ion source gates on the ion beam for a period of time that is sufficient to enable the ion source to achieve a tight focus of the beam at the sample and for further scanning the ion beam across the sample. A laser beam is positioned over the sample and has a wavelength that resonantly ionizes components of the sample that are liberated by action of the scanned ion beam. A detector measures the liberated ionized components and is connected to a display system that provides an image of the distribution of the species on surface of the sample.