The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Dec. 14, 1993
Filed:
May. 20, 1992
Applicant:
Inventors:
Andreas Franz, Kienberg, DE;
Michael Allgauer, Stein/Traun, DE;
Assignee:
Dr. Johannes Heidenhain GmbH, Traunreut, DE;
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G02B / ;
U.S. Cl.
CPC ...
385 37 ; 385 14 ;
Abstract
A measurement device having a correction grating associated with a gauge and deflects two diffracted partial beams overlappingly, at a very small angle (.alpha.), onto a single coupling grating. From there, two waveguides located closely beside one another are used to introduce the beams into a coupler and the beams are superimposed and evaluated in a known manner. Thus, a position measuring device can be drastically reduced in its structural size with the aid of an integrated optical component.