The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Dec. 14, 1993
Filed:
Nov. 02, 1989
Kevin F King, New Berlin, WI (US);
Albert H Lonn, Waukesha, WI (US);
Carl R Crawford, Milwaukee, WI (US);
General Electric Company, Milwaukee, WI (US);
Abstract
A method of reducing image artifacts in images acquired with fan beam, helical scanning, tomographic imaging systems uses half scans of less than 360.degree. of projection data of an imaged object on each side of the slice plane being imaged. The half scans are weighted with half scan weighting factors to compensate for redundant data and are weighted with helical scanning weighting factors to interpolate the half scans projection data to projection data at the slice plane. The imaged object may be moved one slice thickness for each 360.degree. of scanning so that the half scans are concentrated closer to the slice plane thereby reducing interpolation errors. Alternatively, for a series of slice images, the imaged object may be moved one slice thickness for each half scan to reduce average slice acquisition time.