The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Dec. 14, 1993
Filed:
Aug. 11, 1992
Francois Blais, Orleans, CA;
Abstract
To provide a system for the optical ranging of a selected point on a target surface irradiated with light while avoiding false signals from other sources in a cluttered environment, the system employs a combination of the triangulation ranging technique with the Biris ranging technique, i.e. imaging onto a position sensitive photodetector through an apertured mask. This combination enables the respective equations for range that apply to the respective techniques to be combined to generate an equation that is true only for target surface points that are directly on the light beam, hence enabling rejection of false signals on the basis of those that fail to satisfy this latter equation. The system has the advantage of flexibility, in that it permits the light beam to be directed onto the target surface from a wide range of locations relative to the detector. In addition, three dimensional data on the target surface can be obtained by using at least one further light beam inclined to the first beam and a mask with more than two apertures. For many practical applications this latter arrangement avoids a need to scan the target surface relative to the detector.