The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Dec. 14, 1993

Filed:

Aug. 15, 1991
Applicant:
Inventor:

Takahide Ishikawa, Itami, JP;

Assignee:
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
H01L / ; H01L / ;
U.S. Cl.
CPC ...
437 39 ; 437 41 ; 437133 ; 437184 ; 437203 ;
Abstract

A method of fabricating a field effect transistor in which the gate electrode is formed in a multiple step recess including a first recess located on one level and a second recess located on a lower level. The second, narrower recess is nested in the first, wider recess. The method is initiated by growing a first semiconductor layer of a low etch rate on a semiconductor substrate. Then, a second semiconductor layer of a high etch rate is grown on the first semiconductor layer. A resist film having an opening in a selected location is formed on the second semiconductor layer. Using this resist film as a mask, the semiconductor layers are selectively etched. The gate electrode is formed at the bottom of the multiple step recess created by the etching.


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