The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Dec. 07, 1993
Filed:
Apr. 08, 1992
James E Burke, Villa Park, IL (US);
Lester Miller, Forest Park, IL (US);
Picker International, Inc., Highland Hts., OH (US);
Abstract
A toroidal x-ray tube housing (A) has an evacuated interior. An annular anode (B) is connected with the housing closely adjacent the window such that a cooling fluid passage (12) is defined in intimate thermal communication with the anode. A cathode assembly (32) is mounted within the evacuated housing or an annular ring (30) that rotates an electron beam (22) around the large diameter annular anode. In the embodiment of FIGS. 1 and 2, the annular ring is magnetically levitated (40) and rotated by a motor (50). A collimator (62) and filter (64) are rotated with the cathode assembly closely adjacent an electron emitter or cathode cup (32) such that the generated x-rays are collimated and filtered within the x-ray tube. Preferably, a plurality of cathode cups (120) are provided, whose operation is selected by a series of magnetically controlled switches (76). The cathode cup is insulated (106) from the annular ring and isolated by a transformer (104, 112) from the filament current control switches. In the embodiment of FIGS. 4-6, the cathode assembly (C) includes a multiplicity of stationarily mounted electron cups (120) which are selectively actuated to rotate the electrode beam by a switch (130). An electron beam scan control (134) may bias the potential applied to grids (124, 126) to scan the electron beam generated by electron emitter over a commensurate arc length of the anode with the arc length of the emitter. In the embodiment of FIG. 7 , multiple anode surface as well as multiple cathode cups are provided.