The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Dec. 07, 1993

Filed:

Oct. 21, 1992
Applicant:
Inventors:

Richard Wright, Hanover Park, IL (US);

Mark Blitshteyn, Bloomingdale, IL (US);

Assignee:

Tantec, Inc., Schaumburg, IL (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01B / ; G01N / ;
U.S. Cl.
CPC ...
356150 ; 356138 ; 73 6452 ;
Abstract

A method and apparatus for determining the contact angle of a droplet of test liquid on a substrate surface. The apparatus includes a test article support plate, a pipette for depositing a droplet of test liquid onto a substrate surface of the test article, and a lamp for projecting an image of the deposited droplet onto a projection screen with a base line of the image positioned on a horizontal axis line of the screen. The screen further has a protractor scale calibrated to read twice the normal angular value, and a rotatable reference line which upon positioning through a contact point of the droplet with the substrate surface and an apex point of the droplet farthest removed from the substrate surface directly indicates the value of the contact angle of the on the protractor scale.


Find Patent Forward Citations

Loading…