The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Dec. 07, 1993
Filed:
Mar. 10, 1992
Kurt R Phillips, Lafayette, CO (US);
Dylan F Williams, Boulder, CO (US);
The United States of America as represented by the Secretary of Commerce, Washington, DC (US);
Abstract
A test fixture is provided for determining electrical characteristics such as the S-parameters of a MMIC package or interconnect. The fixture enables the measurement, in effect, of multiple standards using only the single test fixture and also accommodates variable port-to-port spacings. The test fixture comprises a U-shaped conductive ground plane having parallel arms defining a space therebetween. A center conductor is located in the space and is disposed in spaced relationship to the arms of the ground plane. A beam lead PIN diode is connected to the center conductor at one end thereof and to the ground plane at the other. An external variable DC voltage source is used to vary the bias state of the diode so that when the fixture is inserted into a package or interconnect, reflection coefficient measurements for the different bias states can be obtained by an automatic network analyzer for use in calculations for determining the characteristics in question.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile