The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Nov. 30, 1993
Filed:
Sep. 26, 1991
Edward L Robertson, Culver City, CA (US);
Hughes Aircraft Company, Los Angeles, CA (US);
Abstract
In an electronically scanned array where each radiating element extends outwardly from a face of the array (10), an intra-array test probe (20) is employed to test the propagation characteristics of an individual radiating element (13). The intra-array test probe (20) is adapted to be removable fitted over the radiating element (13) at one end and coupled to a test instrument at the other end. The intra-array test probe (20) channels RF signals to or from the test instrument to the radiating element (13) under test to test the propagation characteristics of the radiating element.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile