The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Nov. 30, 1993
Filed:
Feb. 24, 1993
International Business Machines Corporation, Armonk, NY (US);
Abstract
Tunneling microscopy can be used to observe simultaneously the topography of a sample surface that is conductive and data related to the magnetic field near the surface. A tunneling microscope apparatus has a cantilever supporting a tip which has a magnetic moment. To use the apparatus according to a first preferred method, a magnetic field alternating at a predetermined frequency is produced by the sample near the sample surface to vibrate the tip by a magnetic interaction with the magnetic moment. To use the apparatus according to a second preferred method, the direction of the magnetic moment of the tip is switched at a predetermined frequency to vibrate the tip by creating an interaction between the magnetic moment and a magnetic field of the sample. For both preferred methods, the tip is maintained at a distance from the sample surface so as to permit a tunneling current to flow. A component of the predetermined frequency of the tunneling current is extracted to obtain a signal for observing the magnetic field.