The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Nov. 16, 1993
Filed:
May. 28, 1991
Toni Laitinen, Oulu, FI;
Timo Piironen, Oulu, FI;
Rautaruukki Oy, Oulu, FI;
Abstract
A method of and an equipment for optical inspection of strip and sheet products for the detection of surface defects, which equipment comprises an image forming apparatus 1, 2 for producing images of successive parts of the surface of a product 3 and for converting the images to analog signals 4, an A/D converter 5 for converting the analog signal to a digital signal 6, and an image analyzing unit 7 for analyzing the digital signal to detect surface defects therefrom. To reduce the data processing capacity required of the image analyzing unit, the equipment further comprises a compression unit 8 arranged between the A/D converter and the image analyzing unit for compressing the digital signal before it is analyzed.