The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Nov. 16, 1993
Filed:
Jun. 08, 1992
Milan Milosevic, Fishkill, NY (US);
Nicolas J Harrick, Ossining, NY (US);
Harrick Scientific Corporation, Ossining, NY (US);
Abstract
A variable angle reflection accessory for use in reflection spectrometry characterized by a pair of fixed ellipsoidal reflectors positioned inside an enclosure adjacent a sample surface on the outside of the enclosure and a pair of rotatable plane mirrors positioned at opposite sides of the sample surface. The spectrometer beam is brought to a focus at the first plane mirror, from which it is reflected off the first ellipsoidal reflector to a focus at the sample surface. The reflected beam follows a corresponding path back to the spectrometer. Rotating the mirrors in unison causes the beam angle of incidence on the sample surface to vary over a wide range while maintaining optical alignments and continuing to center the radiation on the same sample area. The outside positioning of the sample surface allows the accessory to be easily coupled to a purge port of the spectrometer and allows rapid sample exchanges without breaking the purge atmosphere.