The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Nov. 16, 1993

Filed:

Oct. 18, 1991
Applicant:
Inventors:

Gunter Gauglitz, Tubingen-Hagelloch, DE;

Jan Ingenhoff, Tubingen, DE;

Norbert Fabricius, Hockenheim, DE;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01B / ;
U.S. Cl.
CPC ...
356345 ; 356361 ; 385 12 ;
Abstract

A sensor for detecting substances including hydrocarbons includes an integrated optical interferometer in the form of a Mach-Zehnder interferometer having a measuring arm and a comparison arm in a wave guide substrate. A polymer such as polysiloxane is applied as a superstrate to the wave guide in the region of the measuring arm. This superstrate can be penetrated by the substance to be detected. Swelling response, gas absorption, refractive index of the polymer and doping with chromophores or fluorophores, layer thickness and layer length are all parameters which can be adapted for a substance-selective performance. Other means of selection include various superstrates on a number of interferometers mounted parallel on a chip and polychrome measurements in combination with methods of pattern recognition constitute further means of selection.


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