The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Nov. 16, 1993

Filed:

Sep. 20, 1991
Applicant:
Inventors:

Robert A Boeller, Poway, CA (US);

Thomas J Halpenny, Escondido, CA (US);

Josep Tarradas, Banyoles, ES;

Isidre R Martos, Barcelona, ES;

Robert W Beauchamp, Carlsbad, CA (US);

Assignee:

Hewlett-Packard Company, Palo Alto, CA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01D / ;
U.S. Cl.
CPC ...
346-11 ; 250202 ; 346 25 ; 3461 / ; 395103 ;
Abstract

A method of monitoring and controlling the quality of pen markings on a plotting medium by qualifying each pen based on optically sensing across a sample line drawn on an actual medium. During each subsequent plotting task of a particular pen which has been qualified, an actual line plot is optically sensed across a selected point to make a comparison with the sample line. If the actual line plot is unsatisfactory, the deficient pen is replaced and the plot is restarted from the beginning, or retraced from the last good verification, or is stopped to allow the user to select an appropriate corrective procedure.


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