The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Nov. 16, 1993
Filed:
May. 20, 1992
Volker Leonhard, Frankfurt am Main, DE;
Hartmut Erdmann, Steinbach, DE;
Wing F Chu, Frankfurt am Main, DE;
Battelle-Institut e.V., Frankfurt, DE;
Abstract
A method of producing an ion sensitive working electrode for a heavy metal ion sensor, the ion sensitive working electrode including a mixture of Ag.sub.2 S and MeS in which Me represents a heavy metal to be determined in a solution to be measured, the method including applying a conductive layer onto a substrate using at least one thick-film technique selected from the group consisting essentially of screen printing and film casting; applying a layer comprised of a plurality of juxtaposed sections on top of the conductive layer, each section of the plurality of juxtaposed sections being comprised of a mixture of Ag.sub.2 S and MeS, with each section of the plurality of juxtaposed sections containing a different heavy metal, Me; and applying a covering layer on top of the layer comprised of a plurality of juxtaposed sections and on top of at least a portion of the conductive layer, which portion of the conductive layer will contact the solution to be measured in use whereby the covering layer protects the conductive layer from the solution to be measured in use, the covering layer having defined therein a plurality of window regions, one window region for each section of the plurality of juxtaposed sections, whereby the solution to be measured in use is provided access to the layer comprised of a plurality of juxtaposed sections.