The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Nov. 09, 1993
Filed:
May. 29, 1992
Applicant:
Inventor:
Kiichiro Uyama, Tokyo, JP;
Assignee:
Kabushiki Kaisha Toshiba, Kawasaki, JP;
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01N / ;
U.S. Cl.
CPC ...
378 57 ; 378 70 ; 378 86 ;
Abstract
A device for inspecting an article, in which a radiation source irradiates a plane-shaped radiation to an article in order to inspect the content of the article without destroying it. Scattered radiation from the article is applied to a radiation detector through a slit which is formed coincident with a line passing through a focus of the radiation source and which continuously passes a constant full field of scattered radiation. The radiation detector is disposed in parallel with the slit and scattered radiation detected by the radiation detector is displayed as an image of the region of the article which was irradiated by the plane-shaped radiation.