The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Nov. 09, 1993
Filed:
Aug. 06, 1991
Applicant:
Inventors:
Takashi Nagano, Hachiouji, JP;
Jitsunari Kojima, Hachiouji, JP;
Assignee:
Olympus Optical Co., Ltd., Tokyo, JP;
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G02B / ; G01J / ;
U.S. Cl.
CPC ...
359368 ; 359383 ; 2502013 ;
Abstract
A microscope has a plural number of objective lenses switchable from one to another, a memory circuit for storing parfocality data for the individual objective lenses, and a correcting device for correcting imaging conditions on the basis of the parfocality data for an objective lens currently used and another objective lens to be selected for microscopy. The microscope is capable of always providing favorably focused condition even when the objective lenses are switched from one to another for changing observation magnification levels.