The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Nov. 02, 1993
Filed:
Nov. 13, 1991
David S Reed, Truckee, CA (US);
James J Psotka, Reno, NV (US);
Perten Instruments North America, Inc., Reno, NV (US);
Abstract
An optical analyzing apparatus (20) for obtaining a quantitative correlation spectroscopy measurements of an analyte concentration in a multiple constituent sample (24). The optical analyzing apparatus (20) employs a correlation spectroscopy algorithm which uses preselected wavelength light energy from both the visible light spectrum and the near-infrared (NIR) light spectrum to analyze multiconstituent samples. The optical analyzing apparatus (20) comprises a light emitter mechanism (22) formed for irradiating the sample (24) with a predetermined first wavelength of light energy in the visible light spectrum and a predetermined second wavelength of light energy in the NIR spectrum. The first wavelength is selected to be active in response to the presence of the analyte while the second wavelength is selected to be active in response to the presence of at least one of the remaining constituents in the sample (24). A detector mechanism (50) is positioned to detect one of optical reflectance and transmissivity of the sample (24) after irradiation at the first and second wavelength, whereby the detected one of reflectance and transmissivity can be used in correlation spectroscopy algorithms to obtain a value of the concentration.