The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Nov. 02, 1993

Filed:

Apr. 01, 1992
Applicant:
Inventors:

William G Clark, Pittsford, NY (US);

Philippe Bado, Ann Arbor, MI (US);

Edward F Gabl, Saline, MI (US);

Assignee:

Other;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01J / ;
U.S. Cl.
CPC ...
250226 ; 356432 ;
Abstract

In a pump/probe experiment, information about an event is detected and correlated with an accumulatable quantity representing the elapsed time interval between the arrival of the pump and probe pulses at the experiment. The accumulatable quantity is used to configure the pump and probe sources to eliminate temporal resolution problems caused by pulse timing jitter, the complexity of amplification, continuum generation, and subsequent reamplification, as well as data acquisition rate limitations. Two pulse sources serve as pump and probe pulses respectively. Each pulse is directed at the experiment. A portion of each pump pulse is diverted to a detector before it reaches the experiment, and a portion of each probe pulse is diverted to another detector. The pump and probe pulses are no-coincident in time at the experiment. Quantities related to the time difference and the information imposed on the probe pulse by the experiment are accumulated to obtain data about the temporal evolution of the event.


Find Patent Forward Citations

Loading…