The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Nov. 02, 1993

Filed:

Oct. 13, 1992
Applicant:
Inventors:

Manfred Krause, Viernheim, DE;

Bernd Klein, Ludwigshafen, DE;

Gerhard Schindler, Grundstadt, DE;

Peter Schafer, Ludwigshafen, DE;

Siegfried Notzel, Wilhelmsfeld, DE;

Assignee:

Boehringer Mannheim GmbH, Mannheim, DE;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01N / ;
U.S. Cl.
CPC ...
422 58 ; 422 56 ; 422 60 ; 422 681 ; 435970 ; 435805 ; 436170 ; 436165 ;
Abstract

Test carrier for the analysis of fluids with a frame (2) consisting of at least two parts surrounding a test field opening (6) and with a test field disposed in the test field opening (6). In order to provide such a test carrier with frame with which it is possible to assemble the test field out of several test layers manufactured separately from one another, it is proposed that the test field be designed as a test layer package (7) with test layers (10, 11, 12) resting loosely on one another, the frame (2) comprise two shaped pieces of plastics material, one of which serves as base part (4) and comprises a seat (16) for accommodating the test layers (10, 11, 12), while the other serves as lid part (3) and comprises a bearing surface (17) resting on the topmost layer (10) of the test layer package (7). The lid part (3) and the base part (4) are in addition designed with elastic properties so that the pressure with which the bearing surface (17) presses onto the test layer package (7) is substantially constant in the tolerance range of the thickness of the test field package (7).


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