The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Oct. 26, 1993
Filed:
Apr. 02, 1991
Applicant:
Inventors:
Kazumasa Kurihara, Higashimatsuyama, JP;
Shigeru Yajima, Higashimatsuyama, JP;
Assignee:
Zexel Corporation, Tokyo, JP;
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06F / ;
U.S. Cl.
CPC ...
395650 ; 364D / ; 3642813 ; 364280 ; 3642679 ; 364267 ; 3642513 ;
Abstract
In a method for detecting malfunction in microcomputer system, in which a given job is processed in a multiple task processing manner, it is discriminated whether or not each of tasks was executed normally after the each execution thereof, and each count of counters provided for all of the tasks except for a prescribed task is changed in response to result of the discrimination. Each count of all counters is checked at the time of the execution of the prescribed task to determine whether or not all of the tasks were executed normally.