The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Oct. 26, 1993

Filed:

Mar. 21, 1991
Applicant:
Inventors:

Mihoko Sawada, Chigasaki, JP;

Hiromichi Kinoshiro, Yokohama, JP;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G05B / ; G06F / ;
U.S. Cl.
CPC ...
36447424 ; 36447437 ; 364191 ;
Abstract

Disclosed is an automatic program forming apparatus which automatically forms a part program for extracting the contour measurement position of a measurement object and the measurement condition data from two-dimensional CAD graphic information, and for calculating the XYZ coordinates of the approach position, entering position, etc. of a probe of a three-dimensional contour measurement device at the time of the contour measurement on the basis of the extracted contour measurement position and measurement condition data to thereby control the three-dimensional contour measurement device; and which automatically forms a test program for simulating the measurement operation of the part program in advance.


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