The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Oct. 26, 1993
Filed:
Jun. 01, 1992
Samuel C Lee, Norman, OK (US);
Board of Regents of the University of OK, Norman, OK (US);
Abstract
An apparatus for optically scanning a log and selecting an optimal log orientation for sawing the log into lumber. The apparatus includes a log holder, a camera, and a computer system connected to the camera. The log holder comprises a set of rollers to facilitate rotation of the log and a red background to provide visual contrast with the log. Fluorescent lights directed toward the log are secured to a frame and directed toward the log to provide uniform lighting for scanning the log. The camera is mounted on the frame for movement parallel with the length of the log to obtain optical images of the entire log, one section at a time. The log is rotated 180.degree. in each section in order to scan the entire outer surface of the log. The computer system comprises an interface for converting the optical images into computer images. The computer system also includes software for generating a computer model of the log and its knots, for simulating the sawing of the log into boards, for grading the boards, and for assigning a value yield to the boards. The computer system determines a value yield for boards cut from the log according to a predetermined sawing pattern at 360 angles of log orientation and selects one angle as an optimal cutting angle. An optimal sawing pattern may be selected as well by determining an optimal value yield for several sawing patterns and selecting the sawing pattern with the highest value yield.