The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Oct. 19, 1993

Filed:

Nov. 30, 1990
Applicant:
Inventors:

Michael M Carrabba, Franklin, MA (US);

Martin W Rupich, Framingham, MA (US);

R David Rauh, Newton, MA (US);

Assignee:

EIC Laboratories, Inc., Norwood, MA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01J / ; G01N / ;
U.S. Cl.
CPC ...
356301 ;
Abstract

A substrate and apparatus for qualitatively and quantitatively detecting constituents of an environment by surface enhanced Raman spectroscopy. The substrate is composed of two separate phases: an adsorbing phase which has an affinity for the molecular constituents of interest, and a metallic phase that possesses the specific geometry, chemical and electromagnetic properties required to enhance emission of Raman signal frequencies of adsorbed molecules. An apparatus is provided which includes a monochromatic light source, a means to transmit the desired wavelength from the light source to the surface substrate surface, a means to collect the scattered Raman signal frequencies and transmit them to a detector, and a means to analyze the recorded response.


Find Patent Forward Citations

Loading…