The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Oct. 19, 1993

Filed:

Sep. 23, 1991
Applicant:
Inventors:

Bernard W Boland, Scottsdale, AZ (US);

Robert B Davies, Tempe, AZ (US);

Paul W Sanders, Scottsdale, AZ (US);

Assignee:

Motorola, Inc., Schaumburg, IL (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H01L / ;
U.S. Cl.
CPC ...
437 47 ; 437 67 ; 437 68 ; 437 33 ; 437919 ;
Abstract

A technique for improving the frequency response of a semiconductor device employing silicon as the semiconductor material. Parasitic components inherent in semiconductor devices degrade the performance of these devices at higher frequencies. Typically, a parasitic capacitor includes a dielectric material sandwiched between a conductive interconnect (31A, 31B) and a substrate (10) or a bottom contact (18). Further, in the past, the thickness of this dielectric material has been similar to that of the third dielectric material (17) of the present invention. However, in the present invention the effective thickness of the dielectric material has been increased by including a first and second dielectric material (15, 16) as well as the third dielectric material (17). Increasing the thickness of the dielectric of a parasitic capacitor decreases the value of the parasitic capacitance; and therefore increases the cut-off frequency of the semiconductor device.


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