The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Oct. 19, 1993
Filed:
Feb. 26, 1991
Applicant:
Inventors:
Akitoshi Toda, Kunitachi, JP;
Shuzo Mishima, Hachioji, JP;
Assignee:
Olympus Optical Co., Ltd., Tokyo, JP;
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01B / ; G01B / ;
U.S. Cl.
CPC ...
73105 ; 250306 ;
Abstract
An atomic probe microscope comprises a cantilever which includes a lever section provided with a probe, a lever attaching section for supporting the lever section, and a positioning striking section formed at the lever attaching section. A cantilever unit comprises a seat for supporting the cantilever and provided with a face against which the positioning striking section is received.