The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Oct. 12, 1993
Filed:
Apr. 30, 1992
Applicant:
Inventor:
Masao Mizuta, Kyoto, JP;
Assignee:
Horiba, Ltd., Kyoto, JP;
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01N / ;
U.S. Cl.
CPC ...
378 45 ; 378 47 ; 378208 ;
Abstract
A fluorescent X-ray analyzer having a source of X-rays and a detector for measuring fluorescent X-rays utilizes a sample cell having an inner and outer cell frame that captures an X-ray transmissive member. The inner cell frame has a lower surface co-planar with a sample measuring surface defined by the X-ray transmissive member. A sample cell stand assembly includes an outer cell frame member and an inner cell frame member with respective apertures. An X-ray transmissive member extends across the central apertures. The inner stand frame member contacts the inner cell frame member to provide a fixed distance relationship between the detector and the sample measuring surface.