The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Oct. 12, 1993

Filed:

Mar. 14, 1991
Applicant:
Inventors:

Takahiro Kanamori, Katsuta, JP;

Shinichi Itoh, Kawasaki, JP;

Assignee:

Hitachi, Ltd., Tokyo, JP;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06F / ;
U.S. Cl.
CPC ...
36441316 ; 36441314 ; 36441315 ;
Abstract

With the apparatus of CT, if the object contains a foreign body having high spatial frequency component such as a polygonal body etc., and large density difference from another region, a radial artifact is generated from a corner part of the side. The first object of the present invention is to provide an apparatus of CT to reduce artifacts without lowering of spatial resolving power. The second object of the present invention is to provide an apparatus of CT to reduce artifacts without increasing scanning time so much. The objects described above are achieved by the present invention with a method to disperse penetration data to surroundings when a sudden changing part of penetration data in translational data is detected in collecting penetration data from every direction for reconstruction of an image.


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