The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Oct. 05, 1993

Filed:

Sep. 19, 1991
Applicant:
Inventors:

Naoyuki Izawa, Mitaka, JP;

Shuji Yoshimura, Kawasaki, JP;

Satoshi Kakuma, Kawasaki, JP;

Assignee:

Fujitsu Limited, Kawasaki, JP;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
H04J / ;
U.S. Cl.
CPC ...
370 15 ; 370 13 ; 370 14 ; 379-5 ; 371 201 ; 371 204 ; 371 205 ;
Abstract

The present invention relates to a transmission line test method in the broadband ISDN for assembling an ATM formatted cell into a frame and sending it in the synchronous optical network (SONET) formatted transmission line as a protocol of an optical fiber communication network. First, test data are inserted into an ATM cell according to a command of the central controlling unit in an ATM switching unit. Then, the test cell is sent through an ATM switch in the ATM switching unit after the insertion of the test data; the test data are extracted from the test cell turned around by an ATM layer provided between the ATM switch and the SONET-formatted transmission line or by a subscriber terminal adapter, or from the test frame (including the test cell) turned around by a terminator in the SONET-formatted transmission line or by a network terminator at a subscriber terminal in the transmission line; and finally a transmission test is conducted by checking the data in the line up to each turnaround point.


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