The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Oct. 05, 1993

Filed:

Aug. 10, 1992
Applicant:
Inventors:

Nariaki Fujiwara, Kyoto, JP;

Tokaji Shibahara, Kyoto, JP;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01B / ;
U.S. Cl.
CPC ...
356373 ;
Abstract

Light emitted from a light source (1) reaches a sample surface (2) via an objective lens (6). An edge (7a) of a louver (7) is located at a a position which is conjugate with a predetermined reference position across the objective lens. When the sample surface is displaced from the reference position, light reflected from the sample surface impinges upon the louver is reflected therefrom and is then detected by a photo-sensor (8). When the surface coincides with the reference position, the light does not reach the photo-sensor. Thus, a displacement of the sample surface from the reference point can be detected by monitoring output signals from the photo-sensor.


Find Patent Forward Citations

Fujiwara, Nariaki. (1993). Displacement detection system (U.S. Patent No. 5251011). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/5251011

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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