The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Oct. 05, 1993
Filed:
Feb. 02, 1993
Applicant:
Inventor:
Alfredo E Bruno, Oberwil, CH;
Assignee:
Ciba-Geigy Corporation, Ardsley, NY (US);
Primary Examiner:
Int. Cl.
CPC ...
G01B / ;
U.S. Cl.
CPC ...
356361 ; 356128 ; 356246 ;
Abstract
A detection cell (4) is part of an interferometer for measuring changes in the refractive index of a medium located in a capillary (2). In order to simplify the evaluation of an interference fringe pattern, the capillary (2) is arranged in a matching fluid (15), the refractive index of which corresponds to that of the material of the capillary. The matching fluid (15) acts at the same time as a temperature-control bath for the capillary, thereby substantially increasing the temperature stability.
Bruno, Alfredo. (1993). Interferometric measuring arrangement for refractive index measurements (U.S. Patent No. 5251009). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/5251009
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile