The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Oct. 05, 1993

Filed:

Oct. 02, 1991
Applicant:
Inventors:

Kuniomi Abe, Kobe, JP;

Susumu Fujita, Kobe, JP;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
A61B / ;
U.S. Cl.
CPC ...
351221 ; 351205 ; 351214 ; 359368 ;
Abstract

An eyeball microscope used for observing or photographing epitherial and endothelial cells and likes of a cornea, which is provided with an illuminating optical system for projecting an illuminating light beam onto an object, an observing optical system for observing or photographing an imaging light beam from the object and parallel slits moving across the optical paths of both optical systems, and arranged to scan the object with optical images of certain slits and, at the same time, to lead the imaging beam from the object through the same number of separate slits into the observing optical system, thereby shutting off all unwanted reflecting beams other than the imaging beam.


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