The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Oct. 05, 1993
Filed:
Jan. 23, 1992
Applicant:
Inventor:
Hisao Harigai, Tokyo, JP;
Assignee:
NEC Corporation, Tokyo, JP;
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01R / ;
U.S. Cl.
CPC ...
3241 / ; 324 731 ;
Abstract
A method of acceleration testing of reliability of an LSI adopting a microprogram is realized simply. In a test mode, a microaddress is progressively incremented '1' by '1' and data processing within the LSI is executed in accordance with a microcode read out from a control memory based on the microaddress. As for a command decoder and an address generator, external data terminals are clamped to a voltage source or to a ground to permit a specific command to be fetched by the LSI under test. In this way, a majority of internal gates within the LSI are activated while the acceleration test is being conducted on the LSI.