The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Oct. 05, 1993

Filed:

Jan. 21, 1992
Applicant:
Inventors:

Tsuyoshi Ohno, Matsudo, US;

Masaru Suzuki, Nagareyama, US;

Tatsuo Horiuchi, Nagareyama, US;

Yasushi Shirahase, Kobe, US;

Koji Kishi, Kobe, US;

Yoshifumi Watazu, Akashi, US;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
C12Q / ; C12Q / ; C12P / ; C12N / ;
U.S. Cl.
CPC ...
435 15 ; 435 25 ; 435 90 ; 435188 ;
Abstract

The present invention relates to a method for determining a slight amount of NADH or XTP which is present in a solution, with high sensitivity by the use of an NADH kinase specific for NADH by utilizing a cycling reaction, and this method permits highly sensitive determination of NADH without any influence of NAD.sup.+ and hence is useful for diagnoses of diseases and the like.


Find Patent Forward Citations

Ohno, Tsuyoshi. (1993). Method for highly sensitive determination of nadh using kinase (U.S. Patent No. 5250416). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/5250416

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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