The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Sep. 28, 1993

Filed:

Sep. 03, 1991
Applicant:
Inventors:

Sandeep Chennakeshu, Clifton Park, NY (US);

Anand Narasimhan, Troy, NY (US);

John B Anderson, Latham, NY (US);

Assignee:

General Electric Company, Schenectady, NY (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
H04B / ; H03K / ;
U.S. Cl.
CPC ...
375101 ; 375 13 ; 375 14 ; 375 16 ; 36472405 ; 364,15 ; 36472417 ; 3647242 ;
Abstract

A received time division multiple access (TDMA) signal having a time slot comprised of a plurality of symbols including at least one sequence of synchronizing symbols and a plurality of data symbols is demodulated by adaptively filtering the received signal to minimize inter-symbol interference due to an effect of channel signal propagation delay. The adaptive filtering step is performed by processing the received signal with a multi-stage lattice decision feedback equalizer having (M=N.sub.1 -N.sub.2) stages followed by (N.sub.2 -1) two-dimensional stages. A metric is next formed for each of the stages in accordance with a predetermined mathematical relationship between the output signals of each of two stages. A plurality of the formed metrics are next accumulated over a plurality of time slots. A number of stages are then recursively determined for the lattice decision feedback equalizer for use during the next time slot by comparing, to a threshold value, the difference between the values of two accumulated metrics.


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