The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Sep. 28, 1993

Filed:

Jan. 14, 1991
Applicant:
Inventor:

Michael Foley, Cambridge, MA (US);

Assignee:
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06F / ; G06F / ;
U.S. Cl.
CPC ...
364401 ; 364402 ; 36446401 ; 364468 ; 364156 ;
Abstract

An automated manufacturing cost estimating method and system with indirect cost allocation which identifies a material in an initial state for manufacturing a product in a final state; defines an operation for converting the material from its initial state into the final state of the product; calculates the direct labor cost for each operation based on direct labor hours and calculates the indirect cost specifically allocated for each operation based on consumption of overhead cost elements by the operation; and sums the cost calculated for each operation to determine the total cost of manufacture of a part. Also disclosed is a cost analyzing method and system which utilizes the cost estimating method and system by identifying a plurality of different materials in an initial state for manufacturing a product in a final state and defining a number of manufacturing operations for converting each of the different materials from its initial state into the final state of the product; generating a plurality of paths through the interconnected operations between the different materials in the initial state and the product in the final state; determining a predetermined cost parameter associated with each operation; and accumulating the determined cost parameters along each path.


Find Patent Forward Citations

Loading…