The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Sep. 21, 1993
Filed:
Aug. 16, 1989
Bich Nguyen, San Jose, CA (US);
John F Schipper, Palo Alto, CA (US);
Hewlett-Packard Company, Palo Alto, CA (US);
Abstract
Method and apparatus for calibration of sensors and transducers that (a) takes account of the fact that the output variable value may behave differently as a function of the input variable value in different regions of the input variable value and (b) takes account of variation of the output variable value with changes in a plurality of supplemental variables, for a fixed value of the input variable. A discrete set of reference values of each supplemental variable is chosen, and the representation of output variable value as a function of input variable value is determined for each of the set of reference values of the supplemental variables. The representation is then extended to arbitrary values of the supplemental variables by linear or quadratic interpolation.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile