The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Sep. 21, 1993

Filed:

Jul. 10, 1991
Applicant:
Inventors:

Mikio Kurachi, Aichi, JP;

Toshiaki Mizuno, Gamagori, JP;

Hirokatsu Obayashi, Aichi, JP;

Assignee:

Nidek Co., Ltd., Gamagori, JP;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01B / ;
U.S. Cl.
CPC ...
356127 ; 356125 ;
Abstract

An automatic lensmeter for measuring optical characteristics of a lens to be examined is disclosed. The automatic lensmeter includes a display for displaying thereon an alignment target, first and second calculation devices for converting a shift between the optical center of the lens to be examined and a measurement optical axis into a prism power and a deviation respectively, and device for forming the alignment target at a predetermined position, whereby highly accurate alignment can be attained and accurate marking can be readily obtained.


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