The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Sep. 21, 1993
Filed:
Sep. 08, 1992
Takao Okada, Ibaraki, JP;
Katsuyuki Suzuki, Ibaraki, JP;
Ikegami Tsushinki Co., Ltd., Tokyo, JP;
Abstract
An object to be inspected is, for example, a medical capsule having differently colored surface areas. A beam splitter divides light reflected by the surface of the object into two parts. Each of the divided parts of the light is passed through an optical filter whose transmission wavelength range is set according to the colors of the object, to adjust the quantity of transmitted light from a high-brightness part of the object surface and the quantity of transmitted light from a low-brightness part of the object surface to a reference level. Image pick-up elements pick up images of the object surface according to the divided parts of the light and provide image signals. One of the image signals is selected and provided outside. Unlike a prior art that adjusts levels of signals by amplifying the signals according to brightness of an inspected object, the method and apparatus of the invention do not involve amplification. The invention, therefore, never amplifies noise components to cause errors in inspection, thereby improving inspection accuracy.