The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Sep. 14, 1993

Filed:

Mar. 19, 1991
Applicant:
Inventors:

Tsutomu Tsuyama, Kanagawa, JP;

Toshimasa Harada, Kanagawa, JP;

Sadao Shimoyashiro, Kanagawa, JP;

Koichi Higano, Tochigi, JP;

Toshio Namiki, Tochigi, JP;

Chikaaki Yamaguchi, Tochigi, JP;

Kozo Izui, Tochigi, JP;

Assignee:

Hitachi, Ltd., Tokyo, JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06F / ; G06F / ;
U.S. Cl.
CPC ...
364552 ; 364186 ; 364401 ; 36455101 ; 364554 ;
Abstract

An integrated quality control method and system for explaining failure causes of a product. Information relating to failure of the product and measures taken to correct the failure as well as information relation to manufacture and distribution of the product are collected and inputted for storage in a data base. The information relating to the failure and measures taken to correct the failure is combined with the information relating to the manufacture and distribution of the product and the combined information is analyzed for enabling an estimate of causes of the failure of the product and a trend of possible failures.


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