The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Sep. 14, 1993

Filed:

Jul. 13, 1992
Applicant:
Inventors:

Shuji Hata, Tokyo, JP;

Osamu Murasawa, Tokyo, JP;

Assignee:

Jalco Co., Ltd., Tokyo, JP;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01F / ;
U.S. Cl.
CPC ...
324683 ; 324681 ; 324682 ; 324674 ; 324675 ; 324661 ; 324606 ; 331 65 ;
Abstract

Disclosed is a method of detecting a variation in stray capacitance by use of a PLL circuit. This method involves the steps of: setting respectively a freerunning frequency and a capture range of a phase-locked loop circuit so that a range in which an output frequency of a pre-oscillator changes extends to an interior of the capture range of the phase-locked loop circuit, the output frequency being determined by a synthetic time constant obtained by adding up a variation value of an electric capacitance or the like that is detected by a sensor and a reserve time constant preset in a time constant determining module when detecting the stray capacitance by employing the sensor for detecting the variation in the stray capacitance in contact or non-contact with a body to be detected and a capacitance detecting means including the pre-oscillator having the time constant determining module connected to the sensor and the phase-locked loop circuit connected to the pre-oscillator; detecting a change in a freerunning frequency control voltage in a locked state of the phase-locked loop circuit, the change being caused with the variation in the electric capacitance or the like that is detected by the sensor; and detecting a state variation of the detected body.


Find Patent Forward Citations

Hata, Shuji. (1993). Method of detecting a variation in stray capacitance by use of a pll (U.S. Patent No. 5245295). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/5245295

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

Loading…